X-ray diffraction

Bruker D8 Advance
Powder diffractometer with Bragg-Brentano geometry and CuKα radiation for routine measurements, temperature dependent measurements and experiments under inert conditions
Panalytical X'Pert
Powder diffractometer with Bragg-Brentano geometry and CuKα radiation for routine measurements and temperature dependent measurements
Service Center                  X-Ray Diffraction

Thermal analysis

Netzsch TG F1 Iris
Thermo-microbalance coupled with FT-IR-spectrometer
Netzsch DSC 204 F1 Phoenix
Dynamic difference calorimeter
Netzsch STA409/414
DSC-TG-MS with skimmer coupling, Quadrupol-MS, up to 1480 °C (theoretically up to 1700 °C)
Mettler-Toledo TGA-DSC
Simultaneous TGA and DCS measuring up to 1600°C, connectable to mass spectrometers

Elemental analysis

Determination of N and O in metals
Vario Micro cube  Elementar
Determination of C, H and N.
Service Center   Elemental Analysis

Trace Elemental Analysis

Potenziostat 757 und 797 VA Computrace, Metrohm
AAS Unicam 969
FAAS (Flame-Atom-Absorption-Spektrometry)
Optima 2000 DV, Perkin-Elmer
ICP-OES (Inductive Coupled Plasma - Optic Emission-Spektrometry)
7500cx with HMI, Agilent
ICP-MS (Inductive Coupled Plasma - Mass-Spektrometry)
Coupling techniques:
CE-ICP-MS (CE: Beckman-Coulter  P/ACE-MDQ), HPLC-ICP-MS (HPLC: Agilent 1100/1200 ChemStation)
Service Center           Trace Elemental Analysis


HP Impedance spectrometer HP 4192A
Characterisation of electric properties in materials depending on the frequence (5Hz to 13 MHz)
Perkin Elmer Lambda 750
UV-VIS-NIR-spectrometer for diffuse reflection.
Perkin Elmer Lambda 25
UV-VIS-NIR-Spektrometer for cuvettes
Bruker Vertex 70
Perkin Elmer LS55
Horiba Yobin Ivon FluoroMax 4
Fluorescence-spectrometer (Horiba Scientific Japan)
Horiba Modular, Fiber-Coupled Raman-Spectrometer
Nd:YAG Laser, 532 nm, "SuperHead" measuring head and sample chamber (Horiba Scientific Japan)

Other equipment

Plasma etcher Diener
Plasma device Diener FEMTO (Diener electronic GmbH & Co KG, Plasma-Surface-Technology)
Fritsch Pulverisette 7 premium line
High performance planetary ball mill (centrifugal acceleration: 96 g, integrated measuring system to display pressure and temperature values while milling)
Retsch PM 100
Planetary ball mill (centrifugal acceleration: 33,3 g)
Retsch MM 500 Nano
Vibration mill (cryogenic grinding possible)
ALV/CGS-3 Compact Goniometer System (ALV) for dynamic light scattering (DLS)
Dynamic light scattering for particle size determination
Anton Paar Digital Refractometer Abbemat 350
Digital refractometer nD-range 1,26 to 1,72  with sample well (Anton Paar, Germany)
Anton Paar MCR 301
Plate-plate-rheometer (-150 °C - 450 °C)
For thin-sections and planar devices
Stereo Magnifier
Stereo magnifier with a maximum magnification factor of 110. An improved depth of focus allows to examine sample powders and other samples.
Contact angle measuring system (self-construction)
To determine the wettability of different surfaces
Seven Multi pH-Meter and Conductivity Measuring System (Mettler Toledo)
To determine pH-value and conductivity of aqueous solutions or dispersions
Thermo Scientific Megafuge Centrifuge
Coolable centrifuge with fixed angle rotor for 6x50ml tubes