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Faculties
Equipment
X-ray diffraction
| Bruker D8 Advance |
| Powder diffractometer with Bragg-Brentano geometry and CuKα radiation for routine measurements, temperature dependent measurements and experiments under inert conditions |
| Panalytical X'Pert |
| Powder diffractometer with Bragg-Brentano geometry and CuKα radiation for routine measurements and temperature dependent measurements |
| Service Center X-Ray Diffraction |
Thermal analysis
| Netzsch TG F1 Iris |
| Thermo-microbalance coupled with FT-IR-spectrometer |
| Netzsch DSC 204 F1 Phoenix |
| Dynamic difference calorimeter |
| Netzsch STA409/414 |
| DSC-TG-MS with skimmer coupling, Quadrupol-MS, up to 1480 °C (theoretically up to 1700 °C) |
| Mettler-Toledo TGA-DSC |
| Simultaneous TGA and DCS measuring up to 1600°C, connectable to mass spectrometers |
Elemental analysis
| NOA TC436DR |
| Determination of N and O in metals |
| Vario Micro cube Elementar |
| Determination of C, H and N. |
| Service Center Elemental Analysis |
Trace Elemental Analysis
| Potenziostat 757 und 797 VA Computrace, Metrohm |
| DC/AC-Polarography |
| AAS Unicam 969 |
| FAAS (Flame-Atom-Absorption-Spektrometry) |
| Optima 2000 DV, Perkin-Elmer |
| ICP-OES (Inductive Coupled Plasma - Optic Emission-Spektrometry) |
| 7500cx with HMI, Agilent |
| ICP-MS (Inductive Coupled Plasma - Mass-Spektrometry) |
| Coupling techniques: |
| CE-ICP-MS (CE: Beckman-Coulter P/ACE-MDQ), HPLC-ICP-MS (HPLC: Agilent 1100/1200 ChemStation) |
| Service Center Trace Elemental Analysis |
Spectrometer
| HP Impedance spectrometer HP 4192A |
| Characterisation of electric properties in materials depending on the frequence (5Hz to 13 MHz) |
| Perkin Elmer Lambda 750 |
| UV-VIS-NIR-spectrometer for diffuse reflection. |
| Perkin Elmer Lambda 25 |
| UV-VIS-NIR-Spektrometer for cuvettes |
| Bruker Vertex 70 |
| FT-IR-spectrometer |
| Perkin Elmer LS55 |
| Luminescence-spectrometer |
| Horiba Yobin Ivon FluoroMax 4 |
| Fluorescence-spectrometer (Horiba Scientific Japan) |
| Horiba Modular, Fiber-Coupled Raman-Spectrometer |
| Nd:YAG Laser, 532 nm, "SuperHead" measuring head and sample chamber (Horiba Scientific Japan) |
Other equipment
| Plasma etcher Diener |
| Plasma device Diener FEMTO (Diener electronic GmbH & Co KG, Plasma-Surface-Technology) |
| Fritsch Pulverisette 7 premium line |
| High performance planetary ball mill (centrifugal acceleration: 96 g, integrated measuring system to display pressure and temperature values while milling) |
| Retsch PM 100 |
| Planetary ball mill (centrifugal acceleration: 33,3 g) |
| Retsch MM 500 Nano |
| Vibration mill (cryogenic grinding possible) |
| ALV/CGS-3 Compact Goniometer System (ALV) for dynamic light scattering (DLS) |
| Dynamic light scattering for particle size determination |
| Anton Paar Digital Refractometer Abbemat 350 |
| Digital refractometer nD-range 1,26 to 1,72 with sample well (Anton Paar, Germany) |
| Anton Paar MCR 301 |
| Plate-plate-rheometer (-150 °C - 450 °C) |
| Microscope |
| For thin-sections and planar devices |
| Stereo Magnifier |
| Stereo magnifier with a maximum magnification factor of 110. An improved depth of focus allows to examine sample powders and other samples. |
| Contact angle measuring system (self-construction) |
| To determine the wettability of different surfaces |
| Seven Multi pH-Meter and Conductivity Measuring System (Mettler Toledo) |
| To determine pH-value and conductivity of aqueous solutions or dispersions |
| Thermo Scientific Megafuge Centrifuge |
| Coolable centrifuge with fixed angle rotor for 6x50ml tubes |